Solid-Solid Phase Transformations in Inorganic Materials

Volumes 172-174

doi: 10.4028/

Paper Title Page

Authors: Omar Abbes, Feng Xu, Alain Portavoce, Khalid Hoummada, Vinh Le Thanh, Christophe Girardeaux

Abstract: In recent years, spintronics whose principle is based on controlling the spin of electrons in semiconductor layers is presented as a...

Authors: Tomasz Borowski, Maciej Kowalczyk, Jerzy Jeleńkowski

Abstract: The study was devoted to the thermal stability of the phases present in chromium-less and practically carbon-less Ni27Ti2AlMoNb steel. Steel...

Authors: Bernd Schönfeld, Markus Engelke, Andrei V. Ruban

Abstract: Single crystals of Ni-25.6 at.% Pt and Ni-87.8 at.% Pt were investigated by diffuse x-ray scattering for states of thermal equilibrium (923...

Authors: Ryuichiro Oguma, Syo Matsumura, Tetsuo Eguchi

Abstract: The present authors recently presented the time-dependent Ginzburg-Landau (TDGL) formulation for L12 type ordering process...

Authors: William A. Soffa, David E. Laughlin, Nitin Singh

Abstract: The tetragonal lattice relaxation has been included in the thermodynamics of the fcc→L10 ordering to produce a first-order...

Authors: Oleg I. Gorbatov, Yuri N. Gornostyrev, Andrey R. Kuznetsov, Andrei V. Ruban

Abstract: Short-range order formation in dilute Fe-Si and Fe-Al alloys has been investigated by statistical Monte Carlo simulations with effective...

Authors: Lionel Desgranges, Mathieu Marcet, Yves Pontillon, Françoise Porcher, Jerome Lamontagne, Pierre Matheron, Xavière Iltis, Gianguido Baldinozzi

Abstract: Several samples of (U,Nd)O2 with different Nd content (ranging from 2 to 50 in Nd2O3 mass. %) were...

Authors: Alain Portavoce, Guy Tréglia, Boubekeur Lalmi, Christophe Girardeaux, Dominique Mangelinck, Bernard Aufray, Jean Bernardini

Abstract: Silicide sequential phase formation during tens-of-nanometer-thick metallic film reaction on Si substrate has been extensively studied....

Authors: Khalid Hoummada, Dominique Mangelinck, Alain Portavoce

Abstract: The formation of metal (Ni and Pd) silicide thin films on a Si wafer is analyzed using differential scanning calorimetry (DSC) and...

Authors: Gamra Tellouche, Khalid Hoummada, Dominique Mangelinck, Ivan Blum

Abstract: The phase formation sequence of Ni silicide for different thicknesses is studied by in situ X ray diffraction and differential scanning...


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