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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393

Materials Science Forum Vols. 389-393

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393

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Table of Contents

Paper Title Page

Effects of Surface Treatments of 6H-SiC upon Metal-SiC Interfaces

Authors: Koji Abe, M. Sumitomo, T. Sumi, Osamu Eryu, Kenshiro Nakashima

909

Titanium-Based Ohmic Contact on p-Type 4H-SiC

Authors: K.H. Jung, Nam Ihn Cho, J.H. Lee, Shou Jie Yang, C.K. Kim, Byung Teak Lee, Kyung Hwa Rim, Nam Kyun Kim, Eun Dong Kim

913

Reliable Ohmic Contacts to LPE p-Type 4H-SiC for High-Power p-n Diode

Authors: Roumen Kakanakov, Liliana Kassamakova, N. Hristeva, G. Lepoeva, N.I. Kuznetsov, Konstantinos Zekentes

917

Schottky Barriers for Pt on 6H- and 4H-SiC (0001), (000-1), (1-100) and (1-210) Faces Measured by I-V, C-V and Internal Photoemission

Authors: O. Shigiltchoff, Tsunenobu Kimoto, H. McD. Hobgood, Philip G. Neudeck, L.M. Porter, Robert P. Devaty, Wolfgang J. Choyke

921

Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

Authors: Tomoaki Hatayama, Kazuaki Kawahito, Hiroshi Kijima, Yukiharu Uraoka, Takashi Fuyuki

925

Effect of Temperature Treatment on Au/Pd Schottky Contacts to 4H-SiC

Authors: Liliana Kassamakova, Roumen Kakanakov, Rositza Yakimova, A. Kakanakova-Georgieva, Mikael Syväjärvi, L. Wilzén, Erik Janzén

929

Characteristics of Schottky Diodes on 6H-SiC Surfaces after Sacrificial Anodic Oxidation

Authors: Masashi Kato, Masaya Ichimura, Eisuke Arai

933

Reduction of the Barrier Height and Enhancement of Tunneling Current of Titanium Contacts Using Embedded Au Nano-Particles on 4H and 6H Silicon Carbide

Authors: Sang Kwon Lee, Carl Mikael Zetterling, Mikael Östling, I. Fusegawa, M.H. Magnusson, K. Deppert, L.-E. Wernersson, L. Samuelson, A. Litwin

937

Some Comparative Properties of Diffusion-Welded Contacts to 6H and 4H Silicon Carbide

Authors: Oleg Korolkov, Toomas Rang

941

Electrical Properties of Graphite/p-Type Homoepitaxial Diamond Contact

Authors: Yigang Chen, Mitsuru Hasegawa, S. Yamanaka, Hideyo Okushi, Naoto Kobayashi

945