Gettering and Defect Engineering in Semiconductor Technology X
Solid State Phenomena Volumes 95 - 96
doi:10.4028/www.scientific.net/SSP.95-96
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p105
Processing and Characterization of 300 mm Argon-Annealed Wafers
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2 M
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Authors: Timo Müller, E. Daub, H. Yokota, R. Wahlich, P. Krottenthaler, Wilfried von Ammon
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p111
Thermal Stability of Oxygen Precipitates in Nitrogen-Doped Czochralski Silicon
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433 K
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Authors: De Ren Yang, Hong Jie Wang, Xuegong Yu, Xiang Yang Ma, Duan Lin Que
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p117
Nitrogen Out-Diffusion from Czochralski Silicon Monitored by Depth Profiles of Shallow Thermal Donors
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60 K
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Authors: Vladimir V. Voronkov, A.V. Batunina, G.I. Voronkova, Robert J. Falster
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p123
Vibrational Lifetimes of Hydrogen and Silicon MOSFET Reliability
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88 K
]
Authors: Leonard C. Feldman, G. Lüpke, N.H. Tolk
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p129
Influence of Hydrogen on the Formation of Interstitial Agglomerates in Silicon
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364 K
]
Authors: T. Mchedlidze, Masashi Suezawa
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p135
High Resolution Deep Level Transient Spectroscopy of Hydrogen Interactions with Ion Implantation-Induced Defects in Silicon
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63 K
]
Authors: J.H. Evans-Freeman, N. Abdulgader
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p141
Depth Resolved Defect Analysis by Micro-Raman Investigations of Plasma Hydrogenated Czochralski Silicon Wafers
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1007 K
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Authors: Reinhart Job, Yue Ma, Yue Long Huang, Alexander G. Ulyashin, Wolfgang R. Fahrner, Marie France Beaufort, Jean François Barbot
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p149
Casting Technologies for Solar Silicon Wafers: Block Casting and Ribbon-Growth-on-Substrate
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960 K
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Authors: Andreas Schönecker, L.J. Geerligs, Armin Müller
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p159
Silicon Ribbons for Solar Cells
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824 K
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Authors: Juris P. Kalejs
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p175
Metal Content of Multicrystalline Silicon for Solar Cells and its Impact on Minority Carrier Diffusion Length
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39 K
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Authors: Andrei A. Istratov, Tonio Buonassisi, R.J. McDonald, A.R. Smith, R. Schindler, James Rand, Juris P. Kalejs, Eicke R. Weber
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p181
Carbon-Induced Twinning in Multicrystalline Silicon
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2 M
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Authors: Hans Joachim Möller
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p187
Light-Induced Degradation in Crystalline Silicon Solar Cells
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171 K
]
Authors: Jan Schmidt
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p197
Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations
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103 K
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Authors: Martin Kittler, Winfried Seifert
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p205
Minority Carrier Diffusion Lengths in Multi-Crystalline Silicon Wafers and Solar Cells
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51 K
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Authors: Daniela Cavalcoli, Anna Cavallini, Marco Rossi, Kristian Peter
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p211
Evaluation of Silicon Sheet Film Growth and Wafer Processing via Structural, Chemical and Electrical Diagnostics
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1 M
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Authors: George A. Rozgonyi, J. Lu, R. Zhang, James Rand, Ralf Jonczyk