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HomeMaterials Science ForumMaterials Science Forum Vols. 457-460

Materials Science Forum Vols. 457-460

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460

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Table of Contents

Paper Title Page

Improved AlNi Ohmic Contacts to p-Type SiC

Authors: Bang Hung Tsao, Sam Liu, James D. Scofield

841

Electrical Characterization of Deposited and Oxidized Ta₂Si as Dielectric Film for SiC Metal-Insulator-Semiconductor Structures

Authors: Amador Pérez-Tomás, Dominique Tournier, Josep Montserrat, Narcis Mestres, F. Sandiumenge, José Millan

845

In-Situ Investigation of Carbon Reduction at Ni/4H-SiC Interface Using a Silicon Interlayer

Authors: W.Y. Lee, K.S. Teng, S.P. Wilks

849

The Formation of Low Resistance Ohmic Contacts to 4H-SiC, Circumventing the Need for Post Annealing, Studied by Specific Contact Resistance Measurements and X-Ray Photoelectron Spectroscopy

Authors: Owen James Guy, G. Pope, I. Blackwood, K.S. Teng, W.Y. Lee, S.P. Wilks, Philip Andrew Mawby

853

The Basic Parameters of Diffusion Welded Al Schottky Contacts to p- and n-SiC

Authors: Oleg Korolkov, Natalja Sleptsuk, J. Ruut, Toomas Rang

857

Schottky-Ohmic Transition in Nickel Silicide/SiC-4H System: the Effect of Non Uniform Schottky Barrier

Authors: Francesco La Via, Fabrizio Roccaforte, Vito Raineri, Marco Mauceri, Alfonso Ruggiero, Paolo Musumeci, Lucia Calcagno

861

Effects of Thermal Treatments on the Structural and Electrical Properties of Ni/Ti Bilayers Schottky Contacts on 6H-SiC

Authors: Fabrizio Roccaforte, Francesco La Via, A. Baeri, Vito Raineri, Lucia Calcagno, F. Mangano

865

Electrical Characterization of Inhomogeneous Ni₂/Si/SiC Schottky Contacts

Authors: Fabrizio Roccaforte, Francesco La Via, Vito Raineri, R. Pierobon, E. Zanoni

869

Study of TiW/Au Thin Films Metallization Stack for High Temperature and Harsh Environment Devices on 6H Silicon Carbide

Authors: A. Baeri, Vito Raineri, Fabrizio Roccaforte, Francesco La Via, Edoardo Zanetti

873

High Temperature and High Power Stability Investigation of Al-Based Ohmic Contacts to p-Type 4H-SiC

Authors: Roumen Kakanakov, L. Kasamakova-Kolaklieva, N. Hristeva, G. Lepoeva, J.B. Gomes, Iva Avramova, Ts. Marinova

877