Volumes

Solid State Phenomena
Vol. 92

Solid State Phenomena
Vols. 90-91

Solid State Phenomena
Vol. 89

Solid State Phenomena
Vol. 88

Solid State Phenomena
Vol. 87

Solid State Phenomena
Vols. 85-86

Solid State Phenomena
Vols. 82-84

Solid State Phenomena
Vols. 80-81

Solid State Phenomena
Vols. 78-79

Solid State Phenomena
Vols. 76-77

Solid State Phenomena
Vols. 73-75

Solid State Phenomena
Vol. 72

Solid State Phenomena
Vol. 71

HomeSolid State PhenomenaSolid State Phenomena Vols. 82-84

Solid State Phenomena Vols. 82-84

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.82-84

Export:

ToC:

Table of Contents

<<
<
…
4
5
6
7
8
…
>
>>

Paper Title Page

Dopant Segregation on Cavities Induced by Helium Implantation: The Case of Boron and Phosphorus

Authors: Frédéric Cayrel, Daniel Alquier, F. Roqueta, Laurent Ventura, Christiane Dubois, Robert Jérisian, D. Mathiot

309

Hydrogen Redistribution and Void Formation in Hydrogen Plasma Treated Czochralski Silicon

Authors: Alexander G. Ulyashin, Reinhart Job, Wolfgang R. Fahrner, Dieter Grambole, Folker Herrmann

315

Precipitation Kinetics and Recombination Activity of Cu in Si in the Presence of Internal Gettering Sites

Authors: Andrei A. Istratov, R. Sachdeva, C. Flink, S. Balasubramanian, Eicke R. Weber

323

Iron Solubility in Boron-Doped Silicon and Fe Gettering Mechanism in p/p⁺ Epitaxial Wafers

Authors: Mohammad B. Shabani, Y. Shiina, S. Shimanuki, F.G. Kirscht

331

Copper-Defect and Copper-Impurity Interactions in Silicon

Authors: Stefan K. Estreicher, D. West, P. Ordejón

341

Efficiency of Intrinsic Gettering for Copper in Silicon

Authors: Seiichi Isomae, Hidetsugu Ishida, Toshihiko Itoga, Kazuyuki Hozawa

349

Nickel Gettering in Silicon: Role of Oxygen

Authors: G. Regula, R. El Bouayadi, Bernard Pichaud, E. Ntsoenzok

355

Electrical Activity of Dislocations in Si Decorated by Ni

Authors: Vitaly V. Kveder, Wolfgang Schröter, Michael Seibt, Andreas Sattler

361

Comparison of Nickel and Iron Gettering in Cz Silicon Wafers

Authors: F.G. Kirscht, B. Orschel, S. Rouvimov, M. Shabani

367

Recombination Lifetimes of Iron-Contaminated Silicon Wafers: Characterization Using a Single Set of Capture Cross-Sections

Authors: M. Rommel, G. Zoth, M. Ullrich, Heiner Ryssel

373

<<
<
…
4
5
6
7
8
…
>
>>